As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Getting an integrated circuit (IC) from design to test is an arduous process that encompasses a number of steps, including: This is an iterative process and can take months, so every step should be ...

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

As the founder and CEO of an automated software testing company, I’ve been following the trends in this space closely, and it's exciting to see that the automation testing market is estimated to more ...