AZOM

AFM for Critical Dimension: Metrology of Trenches, Lines and Gratings

Electronic devices are getting smaller and more efficient, and thus require higher quality in the inspection of semiconductor microfabrication processes. Characterizing critical dimensions of various ...
Nasdaq

Applied Materials’ New eBeam Metrology System Paves the Way to High-NA EUV Lithography

SANTA CLARA, Calif., Feb. 28, 2023 (GLOBE NEWSWIRE) -- Applied Materials, Inc. today introduced a new eBeam metrology system specifically designed to precisely measure the critical dimensions of ...
Polygon

Critical Role’s Matt Mercer will lead Dimension 20’s Crown of Candy prequel

Critical Role’s Matt Mercer will return to the dome in Dimension 20’s newest Dungeons & Dragons actual play series, titled The Ravening War. The all-star table will include experienced Dungeon Masters ...
Game Rant

Here's How the SAG-AFTRA Strike will Affect Critical Role and Dimension 20

Critical Role and Dimension 20 recently put out statements in support of the SAG-AFTRA strike. That said, both Dungeons and Dragons actual play shows are taking different approaches towards the strike ...
Semiconductor Engineering

CDSAXS Milestones And Future Growth of X-ray-Based Metrology for 3D Nanostructures Important To Chip Industry

A new technical paper titled “Review of the key milestones in the development of critical dimension small angle x-ray scattering at National Institute of Standards and Technology.” “An x-ray ...